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SOFC Microstructures (PFIB-SEM and synthetic) from JPS 2018
This is the microstructural data used in the publication "Mesoscale characterization of local property distributions in hetergeneous electrodes" by Tim Hsu, William K. Epting,... -
Additive Manufacturing Benchmark Test Series (AM-Bench) 2018 Test Descriptions
The Additive Manufacturing Benchmark Test Series (AM-Bench) is developing a continuing series of controlled benchmark tests, in conjunction with a conference series, with two...