Background and Induced Leakage Risk on Seismically Active Faults
Data and Resources
Additional Info
Field | Value |
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Last Updated | August 9, 2019, 07:10 (CDT) |
Created | August 9, 2019, 02:05 (CDT) |
Citation | "\"Murray, C. J.; Hou, Z. J.; White, J. A.; Johnson, S. M. Background and Induced Leakage Risk on Seismically Active Faults; NRAP-TRS-III-002-2017; NRAP Technical Report Series; U.S. Department of Energy, National Energy Technology Laboratory: Morgantown, WV, 2017; p 36. DOI: 10.18141/1433144.\"" |
Is NETL associated | "\"Yes\"" |
NETL Point of Contact | "\"Grant Bromhal\"" |
NETL Point of Contact's Email | "\"Grant.Bromhal@hq.doe.gov\"" |
NETL program or project | "\"NRAP\"" |