Geothermal Environmental Exposure Testing of...
URL: https://gdr.openei.org/files/90/UCBerkeley_Pisano_Geothermal_Paper_1.pdf
Report detailing mass change and sputter XPS chemical analysis conducted on silicon, sapphire, silicon carbide (SiC), and aluminum nitride (AlN) after up to 100 hours of exposure testing in water at its critical point.
Additional Information
| Field | Value |
|---|---|
| Data last updated | June 24, 2021 |
| Metadata last updated | November 20, 2025 |
| Created | June 24, 2021 |
| Format | |
| License | Creative Commons Attribution |
| Datastore active | False |
| Has views | True |
| Id | 02fb7d68-1dc0-4b06-a81f-aefde1021ba5 |
| Mimetype | application/pdf |
| Package id | 1526d738-69c6-4918-83cb-cbdb09ede23f |
| Position | 0 |
| State | active |