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Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and ...
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the... -
Calibration Data for Wafer 2 of SRM 3461 - MEMS Cantilever Stiffness
SRM 3461 is an AFM sized chip with an array of seven cantilevers on each chip. The uniformity of the chips offered for sale from wafer 2 is excellent and the SRM certificate... -
Supplementary data for "Distributions of fitness effects for amino acid chang...
McCandlish and Stoltzfus gathered data from deep mutational scanning experiments on 12 proteins, comprising 56641 distinct amino acid replacement mutations. By converting... -
OptSortSph: Sorting Spherical Dielectric Particles in a Standing-Wave Interfe...
Software to predict the optical sorting of particles in a standing-wave laser interference field -
Supplementary data for "Distributions of fitness effects for amino acid chang...
McCandlish and Stoltzfus gathered data from deep mutational scanning experiments on 12 proteins, comprising 56641 distinct amino acid replacement mutations. By converting... -
Supporting Data for Selected Area Electron Beam Induced Deposition of Pt and ...
These are the unprocessed electron back scatter diffraction patterns (EBSPs) collected from the mesas of electron beam induced deposition (EBID) material, in addition to the... -
OptSortSph: Sorting Spherical Dielectric Particles in a Standing-Wave Interfe...
Software to predict the optical sorting of particles in a standing-wave laser interference field
