@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://data.amerigeoss.org/dataset/22fcb49d-af0a-47d6-98e1-a5bb3e6d9e46> a dcat:Dataset ;
    dct:description "Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C." ;
    dct:identifier "22fcb49d-af0a-47d6-98e1-a5bb3e6d9e46" ;
    dct:issued "2025-11-29T06:37:22.429733"^^xsd:dateTime ;
    dct:modified "2025-11-29T06:37:22.429737"^^xsd:dateTime ;
    dct:publisher <https://data.amerigeoss.org/organization/727dbdd5-3f98-4ac0-9d28-5e344558139b> ;
    dct:title "SiC Diode Test Data" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "Gregorz Gilbert Cieslewski" ;
            vcard:hasEmail <mailto:ggciesl@sandia.gov> ] ;
    dcat:distribution <https://data.amerigeoss.org/dataset/22fcb49d-af0a-47d6-98e1-a5bb3e6d9e46/resource/1b2a37e4-1d4f-4476-8b18-ae918ac6dc93> ;
    dcat:keyword "amerigeo",
        "amerigeoss",
        "ckan",
        "geo",
        "geoss",
        "national",
        "north-america",
        "united-states" .

<https://data.amerigeoss.org/dataset/22fcb49d-af0a-47d6-98e1-a5bb3e6d9e46/resource/1b2a37e4-1d4f-4476-8b18-ae918ac6dc93> a dcat:Distribution ;
    dct:issued "2018-08-10T19:05:14.330732"^^xsd:dateTime ;
    dct:modified "2025-11-29T06:37:22.423732"^^xsd:dateTime ;
    dct:title "Web Resource" ;
    dcat:accessURL <https://gdr.openei.org/submissions/441> ;
    dcat:mediaType "application/unknown" .

<https://data.amerigeoss.org/organization/727dbdd5-3f98-4ac0-9d28-5e344558139b> a foaf:Agent ;
    foaf:name "US Migrating" .