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Software to Process 3D Scanner Data
This software was developed per the ASTM E3125-17 documentary standard for 3D imaging systems. The software was written in MATLAB and Python and sample sphere data sets are... -
X-ray Metrology for the Semiconductor Industry Tutorial
Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry -
X-ray Metrology for the Semiconductor Industry Tutorial
Video tutorials from NIST workshop on X-ray metrology for the semiconductor industry -
Detection Limits for SEM Image Segmentation
The dataset consists of six collections of SEM images, three trained U-net AI models, and CSV files with image quality metrics and trained AI model accuracy metrics. Each SEM...- zip file with six subfolders containing SEM image collections
- zip file contains mask images and the initial intensity image with max contrast and min noise
- zip contains three folders with TensorFlow AI models
- zip file contains a folder with image quality metrics and a folder with AI model accuracy
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