On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures
Data and Resources
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README file for this data setText
A README data file for this data set, including explanations for data...
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| Field | Value |
|---|---|
| accessLevel | public |
| accrualPeriodicity | irregular |
| bureauCode | {006:55} |
| catalog_@context | https://project-open-data.cio.gov/v1.1/schema/data.json |
| catalog_conformsTo | https://project-open-data.cio.gov/v1.1/schema |
| catalog_describedBy | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
| identifier | ark:/88434/mds2-2824 |
| issued | 2023-04-07 |
| landingPage | https://data.nist.gov/od/id/mds2-2824 |
| language | {en} |
| license | https://www.nist.gov/open/license |
| modified | 2022-10-22 00:00:00 |
| programCode | {006:045} |
| publisher | National Institute of Standards and Technology |
| references | {https://dx.doi.org/10.1109/JMW.2022.3232076} |
| resource-type | Dataset |
| source_datajson_identifier | true |
| source_hash | f46e70de061e05b8cbb943e4c9cc39074f53fbba |
| source_schema_version | 1.1 |
| theme | {"Electronics:Superconducting electronics",Electronics:Electromagnetics} |
| Groups |
|
| Tags |
|
| isopen | False |
| license_id | other-license-specified |
| license_title | other-license-specified |
| maintainer | Dylan Williams |
| maintainer_email | dylan.williams@nist.gov |
| metadata_created | 2025-09-24T02:41:39.584734 |
| metadata_modified | 2025-09-24T02:41:39.584741 |
| notes | This repository contains all of the data published in the figures of the paper "On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures." Manuscript DOI: 10.1109/JMW.2022.3232076Manuscript ID: JMW-2022-0108Manuscript Title: On-Wafer Vector-Network-Analyzer Measurements at mK TemperaturesPublished by: Institute of Electrical and Electronics Engineers (IEEE) |
| num_resources | 18 |
| num_tags | 13 |
| title | On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures |