Web Resource
URL: https://gdr.openei.org/submissions/441
Dataset description:
Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C.
Source: SiC Diode Test Data
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Additional Information
| Field | Value |
|---|---|
| Data last updated | August 10, 2018 |
| Metadata last updated | November 29, 2025 |
| Created | August 10, 2018 |
| Format | application/unknown |
| License | Creative Commons Attribution |
| Datastore active | False |
| Has views | False |
| Id | 1b2a37e4-1d4f-4476-8b18-ae918ac6dc93 |
| No real name | True |
| Package id | 22fcb49d-af0a-47d6-98e1-a5bb3e6d9e46 |
| Position | 0 |
| State | active |
| Webstore last updated | None |
| Webstore url | None |