SiC Diode Test Data
Data and Resources
| Field | Value |
|---|---|
| Groups |
|
| Tags |
|
| isopen | True |
| license_id | cc-by |
| license_title | Creative Commons Attribution |
| license_url | http://www.opendefinition.org/licenses/cc-by |
| maintainer | Gregorz Gilbert Cieslewski |
| maintainer_email | ggciesl@sandia.gov |
| metadata_created | 2025-11-29T06:37:22.429733 |
| metadata_modified | 2025-11-29T06:37:22.429737 |
| notes | Fabricated SiC diodes are tested in the temperature range of 300 degrees C to 600 degrees C. |
| num_resources | 1 |
| num_tags | 8 |
| title | SiC Diode Test Data |