X-ray Micro-Tomography (micro-CT)

X-ray micro-tomography (micro-CT) is a non-destructive imaging technique that provides resolution of material microstructures in three dimensions at scales from hundreds of nanometers to centimeters. The technique is used at NASA Ames Research Center to investigate a variety of advanced materials, including lightweight composite heatshields for atmospheric entry, woven materials, parachute textiles and meteoroids. Data are collected using both synchrotron and laboratory-based X-ray sources. Synchrotron micro-CT is performed in collaboration with the beamline 8.3.2 at the Advanced Light Source at Lawrence Berkeley National Laboratory. High-fidelity digital representations of microstructures obtained from micro-CT are used as framework to perform predictive simulations of effective material properties and material response using high performance computing.

Data and Resources

Field Value
accessLevel public
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identifier https://data.nasa.gov/api/views/f7qz-8dsr
issued 2018-10-01
landingPage https://data.nasa.gov/dataset/x-ray-micro-tomography-micro-ct
modified 2025-05-29
programCode {026:001}
publisher Francesco Panerai
resource-type Dataset
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source_schema_version 1.1
theme {Aerospace}
Groups
  • AmeriGEOSS
  • National Provider
  • North America
Tags
  • AmeriGEO
  • AmeriGEOSS
  • CKAN
  • GEO
  • GEOSS
  • National
  • North America
  • United States
  • asteroids
  • carbon-phenolic-composites
  • composite-materials
  • meteorites
  • microct
  • porous-materials
  • textiles
  • thermal-protection
  • tomography
  • woven-composites
isopen False
license_id notspecified
license_title License not specified
maintainer Francesco Panerai
maintainer_email brody.k.bessire@nasa.gov
metadata_created 2025-09-23T16:59:31.722939
metadata_modified 2025-09-23T16:59:31.722947
notes X-ray micro-tomography (micro-CT) is a non-destructive imaging technique that provides resolution of material microstructures in three dimensions at scales from hundreds of nanometers to centimeters. The technique is used at NASA Ames Research Center to investigate a variety of advanced materials, including lightweight composite heatshields for atmospheric entry, woven materials, parachute textiles and meteoroids. Data are collected using both synchrotron and laboratory-based X-ray sources. Synchrotron micro-CT is performed in collaboration with the beamline 8.3.2 at the Advanced Light Source at Lawrence Berkeley National Laboratory. High-fidelity digital representations of microstructures obtained from micro-CT are used as framework to perform predictive simulations of effective material properties and material response using high performance computing.
num_resources 4
num_tags 18
title X-ray Micro-Tomography (micro-CT)