CMOS-MEMS Microgravity Accelerometer with High-Precision DC Response, Phase I
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| Field | Value |
|---|---|
| accessLevel | public |
| bureauCode | {026:00} |
| catalog_@context | https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld |
| catalog_@id | https://data.nasa.gov/data.json |
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| catalog_describedBy | https://project-open-data.cio.gov/v1.1/schema/catalog.json |
| identifier | TECHPORT_5560 |
| issued | 2005-07-01 |
| landingPage | https://techport.nasa.gov/view/5560 |
| modified | 2020-01-29 |
| programCode | {026:027} |
| publisher | Space Technology Mission Directorate |
| resource-type | Dataset |
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| license_id | notspecified |
| license_title | License not specified |
| maintainer | TECHPORT SUPPORT |
| maintainer_email | hq-techport@mail.nasa.gov |
| metadata_created | 2025-11-23T00:04:32.420304 |
| metadata_modified | 2025-11-23T00:04:32.420309 |
| notes | This Phase I SBIR effort initiates development of a high-sensitivity low-noise all-silicon CMOS-MEMS accelerometer for quasi-steady measurements of accelerations at sub 1 micro-g levels. The accelerometer module includes integrated low-noise CMOS circuitry with active offset and low-frequency noise cancellation to enable high-precision DC measurements. The high-performance of the sensor is enabled by innovation in both MEMS accelerometer and readout circuit technologies: i) Single-crystalline silicon capacitive accelerometer structure. The device has high sensitivity and low thermo-mechanical noise; ii) Innovative high-yield fabrication process that enables formation of high-sensitivity devices on top of CMOS wafers; iii) New and improved low-noise capacitive sensor readout CMOS circuit. This novel microaccelerometer has several NASA applications including measurement of residual accelerations on spacecraft and ground-based low-gravity facilities. |
| num_resources | 4 |
| num_tags | 10 |
| title | CMOS-MEMS Microgravity Accelerometer with High-Precision DC Response, Phase I |