Low-Stress Silicon Cladding for Surface Finishing Large UVOIR Mirrors, Phase II
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| Field | Value |
|---|---|
| Groups |
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| Tags |
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| isopen | False |
| license_id | us-pd |
| license_title | us-pd |
| maintainer | TECHPORT SUPPORT |
| maintainer_email | hq-techport@mail.nasa.gov |
| metadata_created | 2025-11-30T09:25:12.395098 |
| metadata_modified | 2025-11-30T09:25:12.395102 |
| notes | In this Phase I research, ZeCoat Corporation demonstrated a low-stress silicon cladding process for surface finishing large UVOIR mirrors. A polishable cladding is desired for SiC optics so they may be figured in less time, and so they may be polished to levels suitable for UVOIR astronomy. ZeCoat has filed a provisional US patent application for the technology. The proposed process is directly scalable to SiC mirrors several meters in diameter. The process is based on a novel, low temperature, ion-assisted, evaporation technique (IAD), whereby the coating stress of a silicon film may be manipulated from compressive to tensile, in order to produce a near-zero net stress for the complete layer. A Si cladding with little intrinsic stress is essential to allow thick coatings to be manufactured without cracking. A low stress coating also minimizes substrate bending that would otherwise distort the figure of very lightweight mirrors. |
| num_resources | 4 |
| num_tags | 8 |
| title | Low-Stress Silicon Cladding for Surface Finishing Large UVOIR Mirrors, Phase II |