NIST Electron Elastic-Scattering Cross-Section Database - SRD 64 Version 3.2

Note that this SRD is superseded by SRD 64 Version 4.0. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections in electron-atom scattering for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, X-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. These data are also needed for modeling of electron transport in radiation dosimetry, electron-beam lithography, and interactions of ionizing radiation with matter. The database is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized.An analysis of available elastic-scattering cross-section data has been published [A. Jablonski, F. Salvat, and C. J. Powell, J. Phys. Chem. Ref. Data 33, 409 (2004)].

Data and Resources

Field Value
accessLevel public
accrualPeriodicity irregular
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identifier ECBCC1C130072ED9E04306570681B10713
landingPage https://data.nist.gov/od/id/ECBCC1C130072ED9E04306570681B10713
language {en}
license https://www.nist.gov/open/license
modified 2012-01-01 00:00:00
programCode {006:052}
publisher National Institute of Standards and Technology
references {https://www.nist.gov/system/files/documents/srd/SRD64UsersGuideV3-2.pdf}
resource-type Dataset
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source_hash 50a4b959b6b0850a9f2481f82a0097bd7350cbb9
source_schema_version 1.1
theme {"Standards:Reference data"}
Groups
  • AmeriGEOSS
  • National Provider
  • North America
Tags
  • amerigeo
  • amerigeoss
  • analytical-electron-microscopy
  • auger-electron-spectroscopy
  • ckan
  • cross-section
  • elastic-scattering
  • electron-probe-microanalysis
  • electron-scattering
  • electron-spectroscopy
  • electron-transport
  • geo
  • geoss
  • national
  • north-america
  • surface-analysis
  • united-states
  • x-ray-photoelectron-spectroscopy
  • x-ray-spectroscopy
isopen False
license_id other-license-specified
license_title other-license-specified
maintainer Cedric J. Powell
maintainer_email cedric.powell@nist.gov
metadata_created 2025-11-21T01:11:13.293887
metadata_modified 2025-11-21T01:11:13.293891
notes Note that this SRD is superseded by SRD 64 Version 4.0. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections in electron-atom scattering for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, X-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. These data are also needed for modeling of electron transport in radiation dosimetry, electron-beam lithography, and interactions of ionizing radiation with matter. The database is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized.An analysis of available elastic-scattering cross-section data has been published [A. Jablonski, F. Salvat, and C. J. Powell, J. Phys. Chem. Ref. Data 33, 409 (2004)].
num_resources 2
num_tags 19
title NIST Electron Elastic-Scattering Cross-Section Database - SRD 64 Version 3.2