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NIST NIST Backscattering-Correction-Factor Database for Auger Electron Spectr...
This database provides values of backscattering correction factors (BCF) of homogeneous materials for quantitative surface analyses by Auger electron spectroscopy. These BCFs... -
NIST X-ray Photoelectron Spectroscopy Database - SRD 20
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected... -
NIST Electron Elastic-Scattering Cross-Section Database - SRD 64, Version 4.0
Note that this SRD supersedes SRD 64 Version 3.2. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross sections,... -
NIST Electron Elastic-Scattering Cross-Section Database - SRD 64 Version 3.2
Note that this SRD is superseded by SRD 64 Version 4.0. The NIST Electron Elastic-Scattering Cross-Section Database provides values of differential elastic-scattering cross... -
NIST Electron Effective-Attenuation-Length Database - SRD 82
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between... -
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron... -
NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Pos...
The NIST Database of Cross Sections for Inner-Shell Ionization by Electron or Positron Impact provides cross sections for ionization of the K shell and of the L and M subshells...