NIST X-ray Photoelectron Spectroscopy Database - SRD 20

NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 4.1 contains new reference photoelectron binding energies, reference Auger-electron kinetic energies, and reference Auger parameters for many elemental solids. These reference energies were derived from analyses of Handbook data [C. J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)] and are used in calculations of chemical shifts.

Data and Resources

Field Value
accessLevel public
accrualPeriodicity irregular
bureauCode {006:55}
catalog_@context https://project-open-data.cio.gov/v1.1/schema/data.json
catalog_conformsTo https://project-open-data.cio.gov/v1.1/schema
catalog_describedBy https://project-open-data.cio.gov/v1.1/schema/catalog.json
describedBy https://srdata.nist.gov/xps/DataDefinition.aspx
identifier ECBCC1C130062ED9E04306570681B10712
landingPage https://srdata.nist.gov/xps/
language {en}
license https://www.nist.gov/open/license
modified 2012-10-10 00:00:00
programCode {006:052}
publisher National Institute of Standards and Technology
references {https://srdata.nist.gov/xps/intro.aspx,https://datascience.codata.org/articles/abstract/171/,https://dx.doi.org/10.1016/j.elspec.2011.12.001}
resource-type Dataset
source_datajson_identifier true
source_hash 8c2b921012de987299ef5df2c49f10db342fb701
source_schema_version 1.1
theme {"Standards:Reference data"}
Groups
  • AmeriGEOSS
  • National Provider
  • North America
Tags
  • amerigeo
  • amerigeoss
  • auger-electron
  • auger-electron-spectroscopy
  • auger-kinetic-energy
  • auger-parameter
  • binding-energies
  • chemical-shifts
  • ckan
  • doublet-separation
  • electron-spectroscopy-for-chemical-analysis
  • esca
  • geo
  • geoss
  • material-database
  • national
  • north-america
  • photoelectron
  • photoelectron-spectroscopy
  • photoemission
  • surface-analysis
  • united-states
  • wagner-plots
  • x-ray-photoelectron-spectroscopy
  • xps
isopen False
license_id other-license-specified
license_title other-license-specified
maintainer Cedric J. Powell
maintainer_email cedric.powell@nist.gov
metadata_created 2025-11-21T18:49:55.587425
metadata_modified 2025-11-21T18:49:55.587429
notes NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected elements (binding energy, Auger kinetic energy, chemical shift, and surface or interface core-level shift), retrieval of data for selected compounds (according to chemical name, selected groups of elements, or chemical classes), display of Wagner plots, and retrieval of data by scientific citation. For the newer data records, additional information is provided on the specimen material, the conditions of measurement, and the analysis of the data. Version 4.1 contains new reference photoelectron binding energies, reference Auger-electron kinetic energies, and reference Auger parameters for many elemental solids. These reference energies were derived from analyses of Handbook data [C. J. Powell, J. Electron Spectrosc. Relat. Phenom. 185, 1 (2012)] and are used in calculations of chemical shifts.
num_resources 1
num_tags 25
title NIST X-ray Photoelectron Spectroscopy Database - SRD 20