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NIST X-ray Photoelectron Spectroscopy Database - SRD 20
NIST X-ray Photoelectron Spectroscopy Database XPS contains over 33,000 data records that can be used for the identification of unknown lines, retrieval of data for selected... -
NIST Electron Effective-Attenuation-Length Database - SRD 82
The NIST Electron Effective Attenuation Length Database provides values of electron effective attenuation lengths (EALs) in materials at user-selected electron energies between... -
NIST Electron Inelastic-Mean-Free-Path Database - SRD 71
The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) principally for use in surface analysis by Auger-electron...